DB44DB44/T1654—2015納米技術(shù)-粉末狀納米顆粒的特性和測(cè)量2015-09-07發(fā)布2015-12-07實(shí)施廣東省質(zhì)量技術(shù)監(jiān)督局發(fā)布Ⅰ1下列文件對(duì)于本文件的應(yīng)用是必不可少的。凡是注日期的引用文件，僅注日期的版本適用于本文ISO2859SamplingproceduresforinspecISO9277:2010Determinationofthespecificsurfaceareaofsolidsbygasadsorption—BETmethpropertiesISO14887Samplepreparation—DISO18757:2003FineceramicsspecificsurfaceareaofceramicpowdersbygasadsorptionusingtheBETmethodISO/TS27687Nanotechnologies—TerminologyanddefinitionsfornanonanofibreandnanoplateEN13925-1:2003Non-destructivetesting—X-raydiffractionfrompoJISK0131:1996GeneralrulesforX-raydiffractometricanal透射電子顯微術(shù)transmissionelectron212345應(yīng)充分考慮取樣過(guò)程對(duì)測(cè)量結(jié)果的影響。實(shí)際測(cè)量中，可針對(duì)這些影響進(jìn)行校正。例如，機(jī)械力3經(jīng)過(guò)表面修飾（包括表面鍍膜）以及聚集物修飾的納米顆粒相對(duì)于原始的納米顆粒來(lái)說(shuō)，這種修應(yīng)根據(jù)所需的化學(xué)成分從下列分析方法中選取一種或多種進(jìn)行成分測(cè)量，還需給出必要的預(yù)處理c)X射線熒光分析法（XRF）；）；）；m)衰減全反射傅里葉變換紅外光譜（ATR-FTIR）及二次離子質(zhì)譜（SI應(yīng)盡量使用合適的有證標(biāo)準(zhǔn)物質(zhì)對(duì)儀器進(jìn)行校準(zhǔn)和能力驗(yàn)證，也可利用粉體標(biāo)準(zhǔn)物質(zhì)進(jìn)行測(cè)量方成分測(cè)量應(yīng)用案例見(jiàn)ISO3262-6:1998和ISO5由于晶體結(jié)構(gòu)和晶粒尺寸的測(cè)量使用相同的儀器和樣品，所以可在測(cè)完晶體結(jié)構(gòu)后再利用謝樂(lè)公4）；j)所有支持測(cè)量結(jié)果可靠性的其他特殊信息（例如，表明測(cè)試實(shí)驗(yàn)室進(jìn)行的測(cè)量質(zhì)量的客觀證5）；6[1]ISO591-1:2000,Titaniumdioxidepigmentsforpaints—Part1:[2]ISO3262-6:1998,Extendersforpaints—Specificationsandmethodsoftest—Part6:Precipi[3]ISO/TS11931:201Characteristicsandme[4]ISO/TC11937:201Characteristicsandme[5]ISO/TS12805:2011,Nanot[6]ISO/TR12885:2008,Nano[7]ISO29301:2010,Microbeamanalysis—Analyticaltransmicalibratingimagemagnificationbyusingreferencematerialshavingperiodicstr[8]ISO/TR27628:2007,Workplaceatmospheres—Ultrafine,nan—Inhalationexpos