標準解讀

GB/T 44371-2024 是一項針對液氮溫區(qū)下Bi-2223超導帶材的臨界彎曲直徑測量的標準。該標準規(guī)定了在特定低溫環(huán)境下（液氮溫度，約-196°C），如何測定Bi-2223超導材料帶材能夠承受的最大彎曲程度而不損失其超導性能的量化指標，即臨界彎曲直徑。

標準內容概覽

  1. 范圍：明確了標準適用的對象為Bi-2223超導帶材，以及測試環(huán)境為液氮溫區(qū)，旨在為這類超導材料的機械性能評估提供統(tǒng)一的測試方法。

  2. 規(guī)范性引用文件：列出了執(zhí)行該標準時需要參考的其他相關國家標準或國際標準，確保測試方法的準確性和可比性。

  3. 術語和定義：對臨界彎曲直徑、Bi-2223超導帶材等關鍵術語進行了明確界定，便于讀者理解。

  4. 試驗設備與試樣制備：詳細說明了進行測試所需的儀器設備要求及試樣選取、制備的具體步驟，包括試樣的尺寸、形狀以及如何在低溫環(huán)境下保持其狀態(tài)穩(wěn)定。

  5. 試驗條件：規(guī)定了測試過程中應控制的環(huán)境參數(shù)，如液氮溫度的穩(wěn)定維持，以及避免外界因素干擾測試結果的措施。

  6. 試驗方法：闡述了具體的測試操作流程，包括如何施加彎曲力、如何測量彎曲直徑、數(shù)據(jù)記錄等，確保測試過程標準化、可重復。

  7. 數(shù)據(jù)處理與結果判定：提供了數(shù)據(jù)處理規(guī)則，如計算臨界彎曲直徑的方法，以及如何根據(jù)測試結果判斷超導帶材的機械性能是否滿足要求。

  8. 試驗報告：要求測試結束后需編制詳細的試驗報告，包含測試條件、所用設備、試樣信息、測試結果及必要的數(shù)據(jù)分析，以便于結果的交流與追溯。

重要性

該標準的實施有助于統(tǒng)一行業(yè)內的測試標準，提高Bi-2223超導帶材性能評價的一致性和可靠性，對于超導材料的研發(fā)、生產和應用具有重要意義。它不僅有助于材料科學家和工程師優(yōu)化超導帶材的設計與制造工藝，還為超導技術在電力傳輸、磁體技術等領域中的實際應用提供了重要的質量控制依據(jù)。


如需獲取更多詳盡信息，請直接參考下方經(jīng)官方授權發(fā)布的權威標準文檔。

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文檔簡介

ICS

29.050；77.040.01

CCS

H62；H21

中華人民共和國國家標準

GB/T44371—2024

臨界彎曲直徑測量

液氮溫區(qū)Bi-2223超導帶材的

臨界彎曲直徑測量

Criticalbendingdiametermeasurement—

CriticalbendingdiametermeasurementofBi-2223

superconductingwiresinliquidnitrogentemperature

2024-08-23發(fā)布2025-03-01實施

國家市場監(jiān)督管理總局發(fā)布

國家標準化管理委員會

GB/T44371—2024

目次

前言

·····································································································

Ⅲ

引言

·····································································································

Ⅳ

1

范圍

··································································································

1

2

規(guī)范性引用文件

······················································································

1

3

術語和定義

···························································································

1

4

原理

··································································································

2

5

測量裝置

······························································································

2

5.1

概述

······························································································

2

5.2

測量組件

·························································································

2

5.3

U?I特性測量系統(tǒng)

··············································································

3

6

樣品準備和安裝

······················································································

3

6.1

樣品尺寸要求

····················································································

3

6.2

樣品的安裝

······················································································

4

7

測量步驟

······························································································

4

7.1

初始臨界電流測量

···············································································

4

7.2

彎曲狀態(tài)下臨界電流測量

········································································

4

7.3

臨界彎曲直徑測定

···············································································

5

7.4

多次冷熱循環(huán)的影響（可選）

···································································

5

8

結果計算

······························································································

5

8.1

臨界電流計算

····················································································

5

8.2

n?值計算（可選）

···············································································

6

8.3

臨界彎曲直徑計算

···············································································

6

8.4

測量不確定度

····················································································

6

9

測量報告

······························································································

7

9.1

被測樣品詳情

····················································································

7

9.2

測量條件

·························································································

7

9.4

多次冷熱循環(huán)對Ic的影響（可選）

······························································

7

9.5

其他信息

·························································································

7

附錄A（資料性）一種臨界彎曲直徑測量組件及其使用示例

········································

8

附錄B（資料性）不確定度評定

·····································································

13

參考文獻

································································································

17

Ⅰ

GB/T44371—2024

前言

本文件按照GB/T1.1—2020《標準化工作導則第1部分：標準化文件的結構和起草規(guī)則》的規(guī)

定起草。

請注意本文件的某些內容可能涉及專利。本文件的發(fā)布機構不承擔識別專利的責任。

本文件由中國科學院提出。

本文件由全國超導標準化技術委員會（SAC/TC265）歸口。

本文件起草單位：中國科學院電工研究所、中國科學院物理研究所、中國科學院合肥物質科學研究

院、清華大學、華中科技大學、華北電力大學、蘇州新材料研究所有限公司、廣東電網(wǎng)有限責任公司、

上海電纜研究所有限公司、中國電力科學研究院有限公司。

本文件主要起草人：張國民、張東、杜曉紀、靖立偉、史越、楊立紅、顧晨、鄭金星、石晶、

皮偉、王玉山、宋萌、宗曦華、丘明、吳奕龍、賈士奇。

Ⅲ

GB/T44371—2024

引言

高溫超導體在超導電力、超導磁體、超導磁懸浮等多個領域具有廣闊的應用前景。目前，實用高溫

超導材料主要為Bi系和Y系。其中，Bi?2223帶材具備良好超導性能且能制備成長帶，是第一代實用高

溫超導帶材。在高場磁體、超導電纜、超導變壓器等應用裝置中，超導帶材均需要繞制成線圈或者螺旋

通電導體形式，不可避免地發(fā)生彎曲。高溫超導體為陶瓷氧化物材料，機械性能較差，彎曲會導致超導

帶材臨界電流下降。超導帶材存在臨界彎曲直徑，當彎曲直徑小于臨界彎曲直徑時，其臨界電流大幅下

降（如下降到初始值的95%或更低）。所以，在超導裝置設計中需要確定臨界彎曲直徑的大小。

目前，雖然對高溫超導體的臨界電流建立了一些測量標準，如GB/T18502—2018和

GB/T42472—2023,但對于高溫超導帶材的臨界彎曲直徑的測量尚無標準。

本文件基于現(xiàn)有臨界電流測量標準，描述液氮溫區(qū)Bi?2223帶材的臨界彎曲直徑的測量方法，為超

導應用工程技術人員提供指導。

Ⅳ

GB/T44371—2024

臨界彎曲直徑測量

液氮溫區(qū)Bi-2223超導帶材的

臨界彎曲直徑測量

1范圍

本文件描述了在液氮溫區(qū)Bi?2223超導帶材臨界彎曲直徑的測量方法。

本文件適用于矩形截面、銀/銀合金包套且?guī)Р呐R界電流小于300A(77K,自場,1μV/cm)的Bi?

2223超導帶材樣品。

2規(guī)范性引用文件

下列文件中的內容通過文中的規(guī)范性引用而構成本文件必不可少的條款。其中，注日期的引用文

件，僅該日期對應的版本適用于本文件；不注日期的引用文件，其最新版本（包括所有的修改單）適用

于本文件。

GB/T2900.100—2017電工術語

超導電性

GB/T18502—2018臨界電流測量

銀和/或銀合金包套Bi?2212和Bi?2223氧化物超導體的直流臨

界電流

GB/T42472—2023臨界電流測量

銀包套Bi?2

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